Selvamanickam V., Galstyan E., Chen S., Jaroszynski J., Abraimov D., Bradford G., Paidpilli M., Goel C., Sarangi B.
Ключевые слова: HTS, REBCO, coated conductors, tapes, fabrication, MOCVD process, deposition setup, critical current, composition, homogeneity, Jc/B curves, experimental results
Li Y., Selvamanickam V., Galstyan E., Chen S., Rey C.M., Schmidt R.M., Majkic G., Paidpilli M., Goel C., Yerraguravagari V., Jain R., Shyam V., Oad M., Carnes T.H.
Chaud X., Li Y., Selvamanickam V., Galstyan E., Chen S., Song J., Schmidt R., Jaroszynski J., Abraimov D., Majkic G., Bradford G., Sandra J.S., Paidpilli M., Goel C., Yerraguravagari V., Jain R., Kadiyala J.
Ключевые слова: HTS, REBCO, YGdBCO, doping, double-side structures, tapes, fabrication, MOCVD process, texture, X-ray diffraction, current-voltage characteristics, microstructure, experimental results
Selvamanickam V., Galstyan E., Majkic G., Cheng H., Pratap R., Jeong J.S., Yun H., Hernandez F.C., Stokes A., Mkhoyan K.A.
Ключевые слова: HTS, REBCO, YBCO, coated conductors, fabrication, nanoscaled effects, doping effect, nanorods, microstructure, mechanical properties, strain effects, pinning, density
Ключевые слова: HTS, GdYBCO, coated conductors, fabrication, doping effect, deformation, critical caracteristics, stacking fault, measurement setup, measurement technique, strain effects, temperature dependence, loads, critical current, angular dependence, magnetic field dependence, microstructure, experimental results
Selvamanickam V., Galstyan E., Jaroszynski J., Abraimov D., Majkic G., Kar S., Kochat M., Pratap R., Paidpilli M., Goel C.
Selvamanickam V., Galstyan E., Jaroszynski J., Abraimov D., Majkic G., Kar S., Luo W., Sandra J.S., Yerraguravagari V.
Ключевые слова: HTS, GdYBCO, MOCVD process, coated conductors, coils, flexibility, former, Cu-based conductors, bending radius, uniformity, critical current, current density, distribution, trapped field distribution, fabrication, critical caracteristics, current-voltage characteristics, magnetic field dependence, Jc/B curves, experimental results
Ключевые слова: texture, HTS, GdYBCO, coated conductors, MOCVD process, fabrication, deposition setup, new, critical caracteristics, critical current, critical temperature, X-ray diffraction
Ключевые слова: measurement setup, magnetometer, vibration, critical caracteristics, critical current density, temperature dependence, magnetic field dependence, self-field effect, pinning force, experimental results, HTS, coated conductors, films thick, thickness dependence, doping effect, composition, MOCVD process, YGdBCO, in-field performance
Selvamanickam V., Galstyan E., Wang X., Xu A., Jaroszynski J., Abraimov D., Prestemon S.O., Majkic G., Higley H.C., Pratap R.
Li X., Selvamanickam V., Galstyan E., Jaroszynski J., Abraimov D., Kar S., Luo W., Kochat M., Sandra J.S.
Li X., Zhang Y., Selvamanickam V., Galstyan E., Xu A., Majkic G., Gharahcheshmeh M.H., Kukunuru J., Katta R.
Ключевые слова: HTS, YBCO, YGdBCO, coated conductors, MOCVD process, fabrication, control systems, microwave devices, surface, experimental results, numerical analysis
Larbalestier D.C., Zhang Y., Selvamanickam V., Polyanskii A., Galstyan E., Xu A., Kametani F., Jaroszynski J., Abraimov D., Griffin V., Majkic G., Yao Y., Gharahcheshmeh M.H.
Zhang Y., Selvamanickam V., Galstyan E., Xu A., Majkic G., Yao Y., Tao X., Gharahcheshmeh M.H., Mallick R.
Li X., Zhang Y., Selvamanickam V., Galstyan E., Xu A., Majkic G., Gharahcheshmeh M.H., Kukunuru J., Katta R.
Selvamanickam V., Galstyan E., Larbalestier D., Chen Y., Xu A., Liu Y., Hu X., Jaroszynski J., Abraimov D., Majkic G., Lei C., Khatri N.
Ключевые слова: HTS, YGdBCO, coated conductors, MOCVD process, microstructure, doping effect, nanoscaled effects, nanorods, composition, critical current, fabrication
Ключевые слова: HTS, coated conductors, deposition setup, MOCVD process, IBAD process, substrate Hastelloy, fabrication, texture, critical caracteristics, REBCO
Ключевые слова: HTS, YGdBCO, coated conductors, doping effect, composition, critical caracteristics, critical current density, MOCVD process, pinning, IBAD process, substrate Hastelloy, fabrication, critical current, angular dependence, magnetic field dependence, microstructure, experimental results
Li X., Galstyan E., Zhang Y, Xu A., Selvamanickam V., Majkic G., Gharahcheshmeh M. H., Ghaedzadeh A., Delgado L.
Ключевые слова: presentation, HTS, YGdBCO, coated conductors, high field magnets, MOCVD process, critical caracteristics, critical current, angular dependence, doping effect, pinning centers, microstructure, magnetic field dependence, pinning force, Jc/B curves, temperature dependence, irreversibility fields, YGdBCO
Ключевые слова: microstructure, defects, critical caracteristics, critical current, angular dependence, critical current density, precursors, MOD process, magnetic field dependence, REBCO, HTS, doping effect, coated conductors, nanoscaled effects, nanodots, nanorods, pinning, composition, fabrication, presentation, interaction
Xiong X., Selvamanickam V., Galstyan E., Chen Y., Liu Y., Liu J., Majkic G., Soloveichik S., Shi T., Yao Y., Lei C., Khatri N.D.
Ключевые слова: HTS, YBCO, coated conductors multifilamentary, filament arrangements, fabrication, ac losses, experimental results
Ключевые слова: HTS, YBCO, bulk, surface, polishing process, oxygen release, composition, fabrication, length
Ключевые слова: HTS, REBCO, YBCO, coated conductors, doping effect, MOCVD process, microstructure, pinning, defects, nanoscaled effects, nanorods
Selvamanickam V., Galstyan E., Chen Y., Liu Y., Liu J., Majkic G., Shi T., Yao Y., Lei C., Khatri N.D.
Xiong X., Selvamanickam V., Galstyan E., Chen Y., Liu Y., Liu J., Majkic G., Shi T., Lei C., Khatri N.
Selvamanickam V., Galstyan E., Chen Y., Liu Y., Liu J., Majkic G., Shi T., Yao Y., Lei C., Khatri N.D.
Ключевые слова: HTS, YBCO, powder metallurgy, fabrication, magnetization curves, magnetic properties
Beilin V., Dul'kin E.(devgeniy@hotmail.com), Yashchin E., Galstyan E., Lapides Y., Tsindlekht M., Felner I., Roth M.
Ключевые слова: MgB2/Ni, wires, tapes, PIT process, fabrication, mechanical properties, critical current density, critical caracteristics, connectivity
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